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Description
- Calibration standards and resolution test targets for micro CT applications
- Material choices: Au, Ir
- Mounted on a holder
- Fast lead time
Example
Nested Ls in various sizes
Siemens stars
Specifications
Micro CT Test Targets
smallest features
typical
50 nm
limit
15 nm
Area
typical
1 mm²
limit
3 mm²
Aspect ratio
typical
10
limit
> 30
Standard Targets
Critical Feature Size [nm]
100
200
300
400
Height [μm]
1
1.5
4
4
Price for one Sample*
On Request
On Request
On Request
On Request
*Volume Discounts Applicable
Multitude of Designs Available
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